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Probe Cards Probe Station Systems Analytical Probe ATE Board
Analytical Probe
We offer a variety of analytical probes to meet different testing needs. Our RF, mixed-signal, and DC probes are designed to tackle the numerous challenges of various testing environments, delivering durable, high-performance products that exceed customer expectations.
Application field
Device characterization

Device characterization

Modeling

Modeling

Reliability

Reliability

Design de-bug

Design de-bug

Qualification and production test

Qualification and production test

Consulting
Analytical Probe
Ralated Products
Infinity Probe
• Infinity probe is the best-performing RF probe in the industry, featuring exceptional measurement accuracy and repeatability
• Typical contact resistance < 0. 05 Ω on Al, <0.02Ω on Au
• Typical insertion loss 0.7 dB (DC to 40 GHz, GSG)
• Save valuable wafer space and reduce pad parasitic by being able to shrink pad geometries to 25 x 35 µ m (best case)
ACP Probe
• Good visibility at probe tip allows accurate placement on DUT contact‑pads
• Outstanding compliance for probing non-planar surfaces
• Stable and repeatable over-temperature measurements
• Typical probe life of 500,000 touchdowns on gold pads
|Z| Probes
• Incredibly long lifetime (typically > 1,000,000 touchdowns on Al pads)
• 1MX technology ensures low insertion loss, high isolation and accurate measurements
• High Power Versions for you RF power measurement needs
T-Wave Probes
• Ability to characterize 1.1 THz devices
• Typical Insertion loss < 1.5 dB between 140 and 220 GHz
• Integrated DC bias-T with lowprofile GPPO connector
Multi-contact RF Probes
• We offer customized multi-point RF probes for different series, including INFQ, ACP-Q, Unity, and Multi-Z
• INFQ probe provide customizable configuration up to 25 contacts: RF, Eye-Pass power, ground, logic
• ACP-Q probe combine DC and RF in a single probe module: One dual probe or a maximum of three separate RF. Maximum of 9 DC standard (other quantities upon request)
• Unity probe support up to 12 contacts; any contact can be DC, Power, Logic to 500 MHz, or RF to 20 GHz
• Multi-|Z| Probes allow up to 35 mixed signal contacts on one probe, with optional on-board components
Multi-contact DC Probes
• Customized to customer application, supports up to 24DCs
• Eye-Pass probes feature up to 12 contacts per probe head, maximum DC current 1 A, maximum DC voltage 50 V power bypass
• The DCQ probes use controlled impedance, ceramic blade needles for low noise and high performance (up to 24 contacts)
• The WPH probes feature up to 12 ceramic-bladed, nickel-plated, tungsten needles with a 2 x 12 square pin cable interface
Calibration Substrate
• The ISS and CSR series calibration substrate we provide support all high-frequency probing application
• ISS is the only calibration substrate in the industry that supports the LRRM method
• CSR is a calibration substrate specifically designed for Z-probes
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